Museology Master of Arts Program

“It is the collaboration between UW’s Museology Program, the American Alliance of Museum’s Curators Committee, and the Chicago History Museum that makes the Excellence in Exhibition Label Writing Competition so valuable.

The purpose of the competition is to elevate the quality of museum communication with visitors, and the involvement of the UW Museology students insures that we are not simply recognizing the excellent work of current label copy writers and editors, but are also helping to develop the next generation of museum professionals.”

– John Russick, Vice President for Interpretation and Education, Chicago History Museum

Each year, during the Marketplace of Ideas at the AAM Annual Meeting, professionals from every corner of the field gather to share ideas and celebrate the year’s best in exhibition label writing. The forum for their conversations is a display showcasing the recognized entries for the Excellence in Exhibition Label Writing Competition presented by CurCom (AAM Curators Committee). In a field that puts such emphasis on community and collaboration, it is no surprise that the event feels more a brainstorming session than an awards display.

The 2020 competition marks the eighth and final year that the Museology Program has partnered with CurCom to organize the Excellence in Exhibition Label Writing Competition. This year, Shiro Burnette, a master’s candidate in the Museology Program, will serve as the competition’s Project Manager. In this role, Shiro will assist in every aspect of the competition, from sending the initial call for entries, to organizing the display at the AAM conference in San Francisco, CA  May 17-20, 2020. Through this partnership, the competition has become not only a chance for professionals to share their best work, but an opportunity for a graduate student to gain firsthand leadership experience, and make valuable connections in the museum field.

To learn more about the competition, browse previous years’ winners, and submit your own label, see AAM’s website.