Scott M Kuehner
Materials analysis using electron beams, including electron-target interactions, wave and energy dispersive x-ray analysis, scanning electron microscopy, and applications of these and related techniques to geological problems.
The class will cover various aspects of electron beam -> sample interaction, the operation of a JEOL 733 electron microprobe, and how to utilize theory and hardware to obtain quantitative analysis of inorganic solids.
Additional related lecture topics will include an overview of transmission electron microscopy, x-ray diffraction, and an introduction to mass spectroscopy.
Student learning goals
Understand the origin and analytical use of the signals emitted from solids when bombarded by electron beams.
Understand the basic operation and function of electron column components including lenses, apertures.
Understand the origin of secondary and backscattered electrons and their imaging applications.
Using x-rays for quantitative analysis.
General method of instruction
There are 3-4hrs of lecture and 3hrs lab per week.
Senior or graduate student with 1 year physics and one year chemistry.
Class assignments and grading
Weekly assignments are based on laboratory exercises.
One in class mid-term, one take-home final and a lab project.