Time Schedule:
Satnam Singh
E E 540
Seattle Campus
VLSI testing and design-for-test techniques, covering digital systems, mixed analog-digital systems, integrated sensor systems, and radio-frequency systems. Projects include test algorithm design, testing of fabricated circuits, and parametric testing of state-of-the-art industry circuits. Prerequisite: either E E 477 or E E 525.
Class description
VLSI testing and design-for-test techniques are covered. The course also emphasizes reliability predictions and characterizations for integrated circuits and systems. Students will test the circuits fabricated in previous classes as laboratory work. Prerequisite: EE 535, EE 536 or permission of instructor.
Student learning goals
General method of instruction
Lectures combined with practical work. The weekly homeworks account for 10% of the total course grade.
Recommended preparation
Class assignments and grading
Each project, which accounts for 25% of the total course grade, is either a small design/test assignment or a programming assignment. A design assignment focuses on the design-for-test of logic functions and subsystems; a programming assignment focuses on algorithm implementations and developments.
10% from homework assignments, 25% from each project and 40% for a final report and its presentation. Grading of each homework takes into account: technical contents, presentation styles, clarity in explanations, spellings, etc.
