E E 540
VLSI testing and design-for-test techniques, covering digital systems, mixed analog-digital systems, integrated sensor systems, and radio-frequency systems. Projects include test algorithm design, testing of fabricated circuits, and parametric testing of state-of-the-art industry circuits. Prerequisite: either E E 477 or E E 525.
1. Testing theory and techniques for large-scale integrated circuits and systems. 2. Design techniques to reduce test cost and improve system reliability. 3. Design-for-test techniques for large-scale analog-digital integrated systems, including those operating at high frequencies. 4. Design-for-test techniques for integrated sensor/integrated circuit systems.
Student learning goals
General method of instruction
1. Lectures with emphasis on case studies of practical system test methods. 2. Team-based projects in design and test. 3. Experimental work on a test system, as appropriate.
1. VLSI design 2. Computer and digital system design 3. Experience with integrated circuit layout and simulation
Class assignments and grading
1. Design and test projects 2. Experimental testing of ICs designed by students or commercial ICs, as appropriate.
Weekly homeworks, two major projects and a final project. No exams.