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Instructor Class Description

Time Schedule:

David G. Castner
CHEM E 593
Seattle Campus

Advanced Surface Analysis

Covers the latest advanced in surface analysis instrumentation and methodology, including advanced methods of biorecognition AFM, surface Plasmon resonance, x-ray photoelectron spectroscopy, sum frequency generation spectroscopy, time-of-flight secondary ion mass spectrometry, and multivariate analysis. Prerequisite: either CHEM E 558 or BIOEN 592. Offered: jointly with BIOEN 593; W.

Class description

Latest advances in surface analysis instrumentation and methodology, including advanced methods in Biorecognition AFM, Surface Plasmon Resonance, X-ray Photoelectron Spectroscopy, Sum Frequency Generation Spectroscopy, Time-of-flight Secondary Ion Mass spectrometry, Multivariate Analysis.

Student learning goals

By the end of this course, students should be aware of the latest experiments that can be done and information that be provided by surface analysis methods. They should also be able to analyze and discuss the results obtained from advanced surface analysis instrumentation and methods.

General method of instruction

Recommended preparation

Class assignments and grading

The information above is intended to be helpful in choosing courses. Because the instructor may further develop his/her plans for this course, its characteristics are subject to change without notice. In most cases, the official course syllabus will be distributed on the first day of class.
Last Update by David G. Castner
Date: 01/07/2013