Time Schedule:
Alexandre Pakhomov
MSE 333
Seattle Campus
Principles and applications of analytical techniques, imaging, diffraction and spectroscopy for materials characterization including crystal structures, texture formation, phase analysis. Nano- and micro-structures of materials including defects and second phases, chemistry, bonding, compositions of materials. Demonstrations and lab experiments involving light scattering and diffraction techniques. Prerequisite: MSE 170; MSE 331. Offered: S.
Class description
Principles and applications of microscopy, diffraction and spectroscopy for materials characterization, including crystal structures, defects, texture, phase analysis, bonding. Emphasis on the advanced methods available in well-equipped university and industrial laboratories (optical microscopy and most of XRD not included as they have been studied earlier). Demonstrations of major instrumentation discussed in class: transmission electron microscopy (TEM), scanning electron microscopy (SEM) with energy dispercive spectroscopy (EDS), atomic force microscopy (AFM) scanning tunneling microscopy (STM), x-ray photoemission spectroscopy (XPS), and Raman microscopy. Goal 1: have a clear understanding of the physical basis of techniques available for studies of crystallography, morphology, composition, bonding, valence, defects in engineering materials, their relative advantages and limitations (class and home works!). Goal 2: given an unknown material, being able to choose methods for complete (microstructural) characterization, or the features of interest for a given problem (demos!). Additional goal 3: if the available methods are not sufficient, being able to find additional means through literature (reading assignments!).
Student learning goals
General method of instruction
Recommended preparation
Class assignments and grading
