Time Schedule:
David G. Castner
CHEM E 493
Seattle Campus
Covers the latest advanced in surface analysis instrumentation and methodology, including advanced methods of biorecognition AFM, surface Plasmon resonance, x-ray photoelectron spectroscopy, sum frequency generation spectroscopy, time-of-flight secondary ion mass spectrometry, and multivariate analysis. Prerequisite: either CHEM E 458 or BIOEN 492. Offered: jointly with BIOEN 493; W.
Class description
Latest advances in surface analysis instrumentation and methodology, including advanced methods in Biorecognition AFM, Surface Plasmon Resonance, X-ray Photoelectron Spectroscopy, Sum Frequency Generation Spectroscopy, Time-of-flight Secondary Ion Mass spectrometry, Multivariate Analysis.
Student learning goals
By the end of this course, students should be aware of the latest experiments that can be done and information that be provided by surface analysis methods. They should also be able to analyze and discuss the results obtained from advanced surface analysis instrumentation and methods.
General method of instruction
Recommended preparation
Class assignments and grading