Instructor Class Description

Time Schedule:

• Spring Quarter 2013
• Summer Quarter 2013
• Autumn Quarter 2013

David G. Castner
BIOEN 593
Seattle Campus

Advanced Surface Analysis

Covers the latest advanced in surface analysis instrumentation and methodology, including advanced methods of biorecognition AFM, surface Plasmon resonance, x-ray photoelectron spectroscopy, sum frequency generation spectroscopy, time-of-flight secondary ion mass spectrometry, and multivariate analysis. Prerequisite: either CHEM E 558 or BIOEN 592. Offered: jointly with CHEM E 593; W.

Class description

Latest advances in surface analysis instrumentation and methodology, including advanced methods in Biorecognition AFM, Surface Plasmon Resonance, X-ray Photoelectron Spectroscopy, Sum Frequency Generation Spectroscopy, Time-of-flight Secondary Ion Mass spectrometry, Multivariate Analysis.

Student learning goals

By the end of this course, students should be aware of the latest experiments that can be done and information that be provided by surface analysis methods. They should also be able to analyze and discuss the results obtained from advanced surface analysis instrumentation and methods.

General method of instruction

Recommended preparation

Class assignments and grading

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Modified:May 17, 2013